|
HTS Number
|
Description
|
Unit of Quantity
|
General Rate of Duty
|
Details
|
|
9031 1000.00
|
Machines for balancing mechanical parts
|
No. |
Free
|
More
|
|
9031 2000.00
|
Test benches
|
No. |
1.7%
|
More
|
|
9031 4100.20
|
For inspecting photomasks or reticles used in manufacturing semiconductor devices
|
No. |
|
More
|
|
9031 4100.40
|
For wafers
|
No. |
|
More
|
|
9031 4100.60
|
Other
|
No. |
|
More
|
|
9031 4910.00
|
Profile projectors
|
No. |
Free
|
More
|
|
9031 4940.00
|
Coordinate-measuring machines
|
No. |
Free
|
More
|
|
9031 4970.00
|
For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
|
No. |
Free
|
More
|
|
9031 4990.00
|
Other
|
No. |
Free
|
More
|
|
9031 8040.00
|
Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
|
No. |
Free
|
More
|
|
9031 8080.60
|
For testing electrical characteristics
|
kg |
|
More
|
|
9031 8080.70
|
Other
|
kg |
|
More
|
|
9031 8080.85
|
Other
|
kg |
|
More
|
|
9031 9021.00
|
Of profile projectors
|
kg |
Free
|
More
|
|
9031 9045.00
|
Bases and frames for the coordinate-measuring machines of subheading 9031.49.40
|
kg |
Free
|
More
|
|
9031 9054.00
|
Of optical instruments and appliances of subheading 9031.41 or 9031.49.70
|
kg |
Free
|
More
|
|
9031 9059.00
|
Other
|
kg |
Free
|
More
|
|
9031 9070.00
|
Of articles of subheading 9031.80.40
|
kg |
Free
|
More
|
|
9031 9091.30
|
Of machines for balancing mechanical parts
|
kg |
|
More
|
|
9031 9091.60
|
Of test benches
|
kg |
|
More
|