晶圆TC测量系统 Customs Classification Inquiry

Status Closed
Create 2026-06-29 08:06
Update 2026-06-29 12:56
Deadline 2026-07-06 08:06
Close 2026-06-29 12:56

Inquiry Information

Industry Category
机器/设备
Chinese Product Name
晶圆TC测量系统
English Product Name
WAFER TC Measurement System
Intended Use
在半导体制造工艺中测量和监控晶圆温度的系统
Brand (Chinese and English)
-
Model
由晶圆温度测量传感器和信号处理装置组成的温度测量系统
Other related product information
-
Working Principle
-
Function
半导体工艺用晶圆温度测量及监控
Answered (Unclassifiable)
Recommended Code
The classification of this product cannot be determined
Finalization Reason
The classification rationale is visible only to the creator and experts
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GXG
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2026-06-29 12:56